systèmes de palettisation

The original by ZEISS

             

Pallet systems offer a variety of advantages for your everyday measuring tasks:

◾ fixturing of the workpiece apart from the machine - this saves valuable machine capacity for the actual measuring
◾ change pallets in a twinkling - reduce downtime additionally
◾ the workpiece is easily positioned for a repeatable measurement
◾ by means of the calibration pallet, the calibration is made repeatable and in the center of the measuring space, without time-consuming mounting

The pallet system OMEGA is designed for optical measuring machines such as O-INSPECT or O-SELECT.
The pallet system THETA is made for tactile measuring machines, such as bridge type or production cmm
The pallet system GAMMA is designed for the CT measuring machine METROTOM.

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